![CMP slurry](https://www.malvernpanalytical.com/resource/img/placeholder.png?quality=60)
![CMP slurry](https://www.malvernpanalytical.com/resource/img/placeholder.png?quality=60)
Metrology solutions for bulk and thin film-based electronic components manufacturing
The advancements in materials research and semiconductor technology have brought great changes to the way we live. They have driven developments in almost every aspect of our daily life – phones, smart wearables and toys, laptops, wireless networks, home infotainment systems, cars, and smart meters.
The electronic display, data storage, and RF filter technology industries have rapidly advanced, and the rate of change continues to follow Moore’s law. Growth technologies now allow the deposition of multilayered structures with individual layers exhibiting film thickness from microns down to monolayers.
Typical materials involved in advanced thin film devices are semiconductors, metal alloys, dielectrics, oxides, and polymers. This mandates accurate monitoring and control of the device parameters using multiple investigation techniques. Equally important is the fine control over the process materials, like CMP slurry, which is an indispensable part of any thin-film device manufacturing.
Malvern Panalytical is closely associated with the electronics industry with a wide range of solutions across the entire value chain: